61 search results - page 8 / 13 » Statistical Leakage and Timing Optimization for Submicron Pr... |
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
TVLSI
2008
13 years 7 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Adaptive body biasing (ABB) is a powerful technique that allows post-silicon tuning of individual manufactured dies such that each die optimally meets the delay and power constrai...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
Process and environmental variations continue to present significant challenges to designers of high-performance integrated circuits. In the past few years, while much research has...
ASPDAC
2008
ACM
13 years 9 months ago
2008
ACM
This paper investigates methods for minimizing the impact of process variation on clock skew using buffer and wire sizing. While most papers on clock trees ignore data-path circuit...