The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael ...
As research begins to explore potential nanotechnologies for future post-CMOS integrated systems, modeling and simulation environments must be developed that can accommodate the c...
When estimating the dynamic power dissipated by a circuit dierent methods ranging from numeric analog simulation to event-driven logic simulation have been proposed. However, as ...
Abelardo Pardo, R. Iris Bahar, Srilatha Manne, Pet...
This tutorial paper describes different approaches to modeling and simulation of mixed-technology microsystems that consist of electrical circuits connected to subsystems describe...