1459 search results - page 242 / 292 » Statistical Modeling for Circuit Simulation |
ISQED
2007
IEEE
14 years 5 months ago
2007
IEEE
Due to the roaring power dissipation and gaining popularity of 3D integration, thermal dissipation has been a critical concern of modern VLSI design. The availability for chip-lev...
ISPD
2006
ACM
14 years 5 months ago
2006
ACM
The existing decoupling capacitance optimization approaches meet constraints on input impedance for package. In this paper, we show that using impedance as constraints leads to la...
VLSID
2005
IEEE
14 years 4 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
ISLPED
2003
ACM
14 years 4 months ago
2003
ACM
We introduce and analyze the ground bounce due to power mode transition in power gating structures. To reduce the ground bounce, we propose novel power gating structures in which ...
VLSID
2004
IEEE
14 years 11 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...