1459 search results - page 51 / 292 » Statistical Modeling for Circuit Simulation |
ICCAD
2006
IEEE
14 years 8 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
ICCAD
2002
IEEE
14 years 8 months ago
2002
IEEE
In this paper we present an advanced functional extraction tool for automatic generation of high-level RTL from switch-level circuit netlist representation. The tool is called FEV...
BMAS
2000
IEEE
14 years 3 months ago
2000
IEEE
— Sigma-Delta digital to analog converters are less vulnerable to circuit imperfections than their A/D counterparts because they have their noise-shaping loop all in the digital ...
VTS
2005
IEEE
14 years 4 months ago
2005
IEEE
— A closed-form model for simulation and analysis of voltage transients caused by single-event upsets (SEUs) in logic circuits is described. A linear RC model, derived using a SP...
ENGL
2008
13 years 11 months ago
2008
Abstract--The development of the transformer insulation failure undergoes three stages: insulation aging, incipient faults and a short circuit. This paper presents a complete schem...