In this paper, we present a novel statistical full-chip leakage power analysis method. The new method can provide a general framework to derive the full-chip leakage current or po...
Ruijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai...
— As the technology scales into 90nm and below, process-induced variations become more pronounced. In this paper, we propose an efficient stochastic method for analyzing the vol...
In this paper, we present an approved linear-time algorithm for statistical leakage analysis in the present of any spatial correlation condition (strong or weak). The new algorith...
In this paper, we present a novel method for estimating the effective number of independent variables in imaging applications that require multiple hypothesis testing. The method ...
Stochastic Petri nets (SPNs) have proven to be a powerful and enduring graphically-oriented framework for modelling and performance analysis of complex systems. This tutorial focu...