31 search results - page 4 / 7 » Statistical reliability analysis under process variation and... |
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
SIGMOD
2007
ACM
14 years 7 months ago
2007
ACM
Many database applications require the analysis and processing of data streams. In such systems, huge amounts of data arrive rapidly and their values change over time. The variati...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...
DATE
2010
IEEE
14 years 19 days ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...