2286 search results - page 18 / 458 » Statistical timing analysis based on a timing yield model |
127
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ISQED
2009
IEEE
15 years 11 months ago
2009
IEEE
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
150
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BMCBI
2010
15 years 4 months ago
2010
Background: Oligonucleotide arrays have become one of the most widely used high-throughput tools in biology. Due to their sensitivity to experimental conditions, normalization is ...
115
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DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
In this paper, we highlight a fast, effective and practical statistical approach that deals with inter and intra-die variations in VLSI chips. Our methodology is applied to a numb...
135
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
151
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...