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» Statistical timing analysis based on a timing yield model
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CSDA
2008
98views more  CSDA 2008»
15 years 4 months ago
Forecasting binary longitudinal data by a functional PC-ARIMA model
The purpose of this paper is to forecast the time evolution of a binary response variable from an associated continuous time series observed only at discrete time points that usual...
Ana M. Aguilera, Manuel Escabias, Mariano J. Valde...
DAC
2004
ACM
16 years 5 months ago
Abstraction of assembler programs for symbolic worst case execution time analysis
ion of Assembler Programs for Symbolic Worst Case Execution Time Analysis Tobias Schuele Tobias.Schuele@informatik.uni-kl.de Klaus Schneider Klaus.Schneider@informatik.uni-kl.de Re...
Klaus Schneider, Tobias Schüle
FPGA
2007
ACM
153views FPGA» more  FPGA 2007»
15 years 10 months ago
Variation-aware routing for FPGAs
Chip design in the nanometer regime is becoming increasingly difficult due to process variations. ASIC designers have adopted statistical optimization techniques to mitigate the e...
Satish Sivaswamy, Kia Bazargan
ICASSP
2008
IEEE
15 years 11 months ago
Bootstrap tests for the time constancy of multifractal attributes
On open and controversial issue in empirical data analysis is to decide whether scaling and multifractal properties observed in empirical data actually exist, or whether they are ...
Herwig Wendt, Patrice Abry
DDECS
2007
IEEE
175views Hardware» more  DDECS 2007»
15 years 10 months ago
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...