3147 search results - page 117 / 630 » Statistically Hiding Sets |
ICCV
2001
IEEE
14 years 11 months ago
2001
IEEE
We develop a linear model of commonly observed joint color changes in images due to variation in lighting and certain non-geometric camera parameters. This is done by observing ho...
ICCAD
2004
IEEE
14 years 6 months ago
2004
IEEE
— In deep sub-micron technologies, process variations can cause significant path delay and clock skew uncertainties thereby lead to timing failure and yield loss. In this paper,...
AVSS
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper proposes a novel approach of combining an unsupervised clustering scheme called AutoClass with Hidden Markov Models (HMMs) to determine the traffic density state in a R...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
INFOCOM
2006
IEEE
14 years 3 months ago
2006
IEEE
— We focus on detecting intrusions in ad hoc networks using the misuse detection technique. We allow for detection modules that periodically fail to detect attacks and also gener...