We describe an architecture for representing and managing context shifts that supports dynamic data interpretation. This architecture utilizes two layers of learning and three lay...
Nikita A. Sakhanenko, George F. Luger, Carl R. Ste...
- With the increasing levels of variability in the behavior of manufactured nano-scale devices and dramatic changes in the power density on a chip, timely identification of hot spo...
This paperconsidersthe problem of representingcomplex systems that evolve stochastically over time. Dynamic Bayesian networks provide a compact representation for stochastic proce...
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan M...
Presented at First Electrical Science Divisional Symposium, Indian Institute of Science.
This is joint work with Prof David Parkes, Harvard University.