We consider active leakage power dissipation in FPGAs and present a “no cost” approach for active leakage reduction. It is well-known that the leakage power consumed by a digi...
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
With process scaling, leakage power reduction has become one of the most important design concerns. Multi-threshold techniques have been used to reduce runtime leakage power witho...
Puneet Gupta, Andrew B. Kahng, Puneet Sharma, Denn...
I/O placement has always been a concern in modern IC design. Due to flip-chip technology, I/O can be placed throughout the whole chip without long wires from the periphery of the...
Hung-Ming Chen, I-Min Liu, Martin D. F. Wong, Muzh...
Glitches (spurious transitions) are common in electronic circuits. In this paper we present a novel approach to reduce dynamic power in FPGAs by reducing glitches during the routi...