Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...
M. J. Geuzebroek, J. Th. van der Linden, A. J. van...
Power dissipation is quickly becoming one of the most important limiters in nanometer IC design for leakage increases exponentially as the technology scaling down. However, power ...
Dynamically Reconfigurable Processor (DRP)[1] developed by NEC Electronics is a coarse grain reconfigurable processor that selects a data path from the on-chip repository of sixte...
In this paper we address the problem of automatically deriving vocabularies of motion modules from human motion data, taking advantage of the underlying spatio-temporal structure ...
This paper describes the design of a system that significantly improves the performance of telnet data delivery for 3270 and 5250 emulation so that access to legacy applications v...