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112
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DATE
2008
IEEE
104views Hardware» more  DATE 2008»
15 years 9 months ago
Multi-Vector Tests: A Path to Perfect Error-Rate Testing
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
Shideh Shahidi, Sandeep Gupta
113
Voted
DDECS
2007
IEEE
175views Hardware» more  DDECS 2007»
15 years 9 months ago
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
144
Voted
ICST
2009
IEEE
15 years 10 days ago
An Empirical Evaluation of Automated Black Box Testing Techniques for Crashing GUIs
This paper reports an empirical evaluation of four blackbox testing techniques for crashing programs through their GUI interface: SH, AF, DH, and BxT. The techniques vary in their...
Cristiano Bertolini, Glaucia Peres, Marcelo d'Amor...
139
Voted
ICPPW
2006
IEEE
15 years 8 months ago
Dynamic Algorithm Selection in Parallel GAMESS Calculations
Applications augmented with adaptive capabilities are becoming common in parallel computing environments which share resources such as main memory, network, or disk I/O. For large...
Nurzhan Ustemirov, Masha Sosonkina, Mark S. Gordon...
134
Voted
SAC
2005
ACM
15 years 8 months ago
Towards the prioritization of regression test suites with data flow information
Regression test prioritization techniques re-order the execution of a test suite in an attempt to ensure that defects are revealed earlier in the test execution phase. In prior wo...
Matthew J. Rummel, Gregory M. Kapfhammer, Andrew T...