We present a novel specification-based approach for generating tests for products in a software product line. Given properties of features as first-order logic formulas, our app...
Engin Uzuncaova, Daniel Garcia, Sarfraz Khurshid, ...
The asymptotic properties of the quasi-maximum likelihood estimator (QMLE) of vector autoregressive moving-average (VARMA) models are derived under the assumption that the errors ...
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
We introduce a new approach to the problem of collision detection in multi-axis NC-machining. Due to the directional nature (tool axis) of multi-axis NCmachining, space subdivisio...
Oleg Ilushin, Gershon Elber, Dan Halperin, Ron Wei...
This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity...