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ISSRE
2008
IEEE
15 years 9 months ago
Testing Software Product Lines Using Incremental Test Generation
We present a novel specification-based approach for generating tests for products in a software product line. Given properties of features as first-order logic formulas, our app...
Engin Uzuncaova, Daniel Garcia, Sarfraz Khurshid, ...
MA
2011
Springer
204views Communications» more  MA 2011»
14 years 9 months ago
Estimating structural VARMA models with uncorrelated but non-independent error terms
The asymptotic properties of the quasi-maximum likelihood estimator (QMLE) of vector autoregressive moving-average (VARMA) models are derived under the assumption that the errors ...
Y. Boubacar Mainassara, Christian Francq
DAC
2010
ACM
15 years 5 months ago
Efficient fault simulation on many-core processors
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
CAD
2005
Springer
15 years 2 months ago
Precise global collision detection in multi-axis NC-machining
We introduce a new approach to the problem of collision detection in multi-axis NC-machining. Due to the directional nature (tool axis) of multi-axis NCmachining, space subdivisio...
Oleg Ilushin, Gershon Elber, Dan Halperin, Ron Wei...
101
Voted
ICCAD
1994
IEEE
83views Hardware» more  ICCAD 1994»
15 years 6 months ago
A new built-in self-test approach for digital-to-analog and analog-to-digital converters
This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity...
Karim Arabi, Bozena Kaminska, Janusz Rzeszut