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ISCA
2009
IEEE
137views Hardware» more  ISCA 2009»
14 years 5 months ago
A case for an interleaving constrained shared-memory multi-processor
Shared-memory multi-threaded programming is inherently more difficult than single-threaded programming. The main source of complexity is that, the threads of an application can in...
Jie Yu, Satish Narayanasamy
DFT
2003
IEEE
120views VLSI» more  DFT 2003»
14 years 4 months ago
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS)
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Che...
ITC
2003
IEEE
96views Hardware» more  ITC 2003»
14 years 4 months ago
Key Impediments to DFT-Focused Test and How to Overcome Them
In a carefully structured study spanning several months, the authors visited numerous companies focused on Design For Test methodologies in SoC Test, Characterization, and Failure...
Kenneth E. Posse, Geir Eide
ICSE
2009
IEEE-ACM
13 years 9 months ago
Security Test Generation Using Threat Trees
Software security issues have been a major concern to the cyberspace community, so a great deal of research on security testing has been performed, and various security testing te...
Aaron Marback, Hyunsook Do, Ke He, Samuel Kondamar...
ENTCS
2010
103views more  ENTCS 2010»
13 years 8 months ago
Model Testing Asynchronously Communicating Objects using Modulo AC Rewriting
Testing and verification of asynchronously communicating objects in open environments are challenging due to non-determinism. We explore a formal approach for black-box testing by...
Olaf Owe, Martin Steffen, Arild B. Torjusen