6014 search results - page 146 / 1203 » Structural Testing with Use Cases |
105
Voted
ISPD
2000
ACM
15 years 7 months ago
2000
ACM
Recently, a deterministic algorithm based on the O-tree representation has been proposed. This method generates excellent layout results on MCNC test cases with O(n3 ) complexity,...
111
Voted
DFT
2007
IEEE
15 years 9 months ago
2007
IEEE
In the paper, a methodology of developing checkers for communication protocol testing is presented. It was used to develop checker to test IP cores communication protocol implemen...
97
Voted
DATE
2006
IEEE
15 years 8 months ago
2006
IEEE
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
136
click to vote
DMIN
2010
15 years 20 days ago
2010
Recently Vapnik et al. [11, 12, 13] introduced a new learning model, called Learning Using Privileged Information (LUPI). In this model, along with standard training data, the tea...
132
Voted
ALMOB
2007
15 years 2 months ago
2007
Background: Some amino acid residues functionally interact with each other. This interaction will result in an evolutionary co-variation between these residues – coevolution. Ou...