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Structure and Metrology for an Analog Testability Bus
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ITC
1993
IEEE
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ITC 1993
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Structure and Metrology for an Analog Testability Bus
14 years 20 days ago
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Kenneth P. Parker, John E. McDermid, Stig Oresjo
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ICCAD
1996
IEEE
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ICCAD 1996
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Metrology for analog module testing using analog testability bus
14 years 21 days ago
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www.cecs.uci.edu
In this paper, we propose a method to generate high quality test waveform on chip to avoid the parasitic eects in an analog testability bus test environment. For the test response...
Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou, Yuan-Tz...
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