9 search results - page 2 / 2 » Substrate resistance extraction with direct boundary element... |
DAC
2002
ACM
14 years 8 months ago
2002
ACM
For present-day micro-electronic designs, it is becoming ever more important to accurately model substrate coupling effects. Basically, either a Finite Element Method (FEM) or a B...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The sudden increase in systems-on-a-chip designs has renewed interest in techniques for analyzing and eliminating substrate coupling problems. Previous work on the substrate coupl...
CAD
2007
Springer
13 years 7 months ago
2007
Springer
This paper describes a novel algorithm to extract surface meshes directly from implicitly represented heterogeneous models made of different constituent materials. Our approach ca...
DAC
1996
ACM
14 years 54 min ago
1996
ACM
Boundary element methods (BEM) are often used for complex 3-D capacitance extraction because of their efficiency, ease of data preparation, and automatic handling of open regions. ...