241 search results - page 21 / 49 » Symbolic Analysis Methods for Masks, Circuits, and Systems |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
The scaling of CMOS technology into the nanometer era enables the fabrication of highly integrated systems, which increasingly contain analog and/or RF parts. However, scaling into...
ISBI
2008
IEEE
14 years 1 months ago
2008
IEEE
Neurobiologists are collecting large amounts of electron microscopy image data to gain a better understanding of neuron organization in the central nervous system. Image analysis ...
ISPD
2004
ACM
14 years 25 days ago
2004
ACM
High performance integrated circuits are now reaching the 100-plus watt regime, and power delivery and power grid signal integrity have become critical. Analyzing the performance ...
RTSS
1999
IEEE
13 years 11 months ago
1999
IEEE
This paper presents a process algebra for specifying soft real-time constraints in a compositional way. For these soft constraints we take a stochastic point of view and allow arb...
ISQED
2010
IEEE
14 years 2 months ago
2010
IEEE
—Double patterning lithography (DPL) provides an attractive alternative or a supplementary method to enable the 32nm and 22nm process nodes, relative to costlier technology optio...