327 search results - page 32 / 66 » Symbolic Fault Injection |
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
PKC
2005
Springer
14 years 1 months ago
2005
Springer
We present an attack on DSA smart-cards which combines physical fault injection and lattice reduction techniques. This seems to be the first (publicly reported) physical experimen...
SC
2004
ACM
14 years 1 months ago
2004
ACM
Today, clusters built from commodity PCs dominate high-performance computing, with systems containing thousands of processors now being deployed. As node counts for multi-teraflo...
VTS
2003
IEEE
14 years 28 days ago
2003
IEEE
: This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation [1] is first p...
ICES
2005
Springer
14 years 1 months ago
2005
Springer
While the fault repair capability of Evolvable Hardware (EH) approaches have been previously demonstrated, further improvements to fault handling capability can be achieved by exp...