Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
Antonis Papanikolaou, T. Grabner, Miguel Miranda, ...
The increase in packing density has led to a higher power density in the chip which in turn has led to an increase in temperature on the chip. Temperature affects reliability, per...
Anand Ramalingam, David Z. Pan, Frank Liu, Sani R....
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
This paper deals with the automatic dependability analysis of systems designed using UML. An automatic transformations is defined for the generation of models to capture systems d...
In this paper, we propose a technique for leveraging historical field failure records in conjunction with automated static analysis alerts to determine which alerts or sets of ale...
Mark Sherriff, Sarah Smith Heckman, J. Michael Lak...