181 search results - page 15 / 37 » Symbolic system level reliability analysis |
CODES
2006
IEEE
14 years 2 months ago
2006
IEEE
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
ISQED
2006
IEEE
14 years 2 months ago
2006
IEEE
The increase in packing density has led to a higher power density in the chip which in turn has led to an increase in temperature on the chip. Temperature affects reliability, per...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
ISORC
1999
IEEE
14 years 1 months ago
1999
IEEE
This paper deals with the automatic dependability analysis of systems designed using UML. An automatic transformations is defined for the generation of models to capture systems d...
SIGSOFT
2007
ACM
14 years 9 months ago
2007
ACM
In this paper, we propose a technique for leveraging historical field failure records in conjunction with automated static analysis alerts to determine which alerts or sets of ale...