A high-level test synthesis (HLTS) method targeted for delay fault testability is presented. The proposed method, when combined with hierarchical test pattern generation for embed...
The goal of testing is to discriminate between multiple hypotheses about a system--for example, different fault diagnoses--by applying input patterns and verifying or falsifying t...
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk...
Recent developments in runtime verification and monitoring show that parametric regular and temporal logic specifications can be efficiently monitored against large programs. Howev...
Patrick O'Neil Meredith, Dongyun Jin, Feng Chen, G...