64 search results - page 5 / 13 » Synthesis of locally exhaustive test pattern generators |
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
This paper presents 3LSSD, a novel, easilyautomatable approach for scan insertion and ATPG of asynchronous circuits. 3LSSD inserts scan latches only into global circuit feedback p...
IJCAI
1997
13 years 8 months ago
1997
Evaluation of incomplete algorithms that solve SAT requires to generate hard satisfiable instances. For that purpose, the kSAT uniform random generation is not usable. The other g...
COMPSAC
2008
IEEE
13 years 7 months ago
2008
IEEE
Software that has been well tested and analyzed may fail unpredictably when a certain combination of conditions occurs. In Bounded Exhaustive Testing (BET) all combinations are te...
DFT
2003
IEEE
14 years 23 days ago
2003
IEEE
1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...