64 search results - page 8 / 13 » Synthesis of locally exhaustive test pattern generators |
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
FPGA
2008
ACM
13 years 9 months ago
2008
ACM
Pattern-based synthesis has drawn wide interest from researchers who tried to utilize the regularity in applications for design optimizations. In this paper we present a general p...
KES
2004
Springer
14 years 25 days ago
2004
Springer
There is now a huge amount of high quality photometric data available in the literature whose analysis is bound to play a fundamental role in studies of the formation and evolution...
KDD
2008
ACM
14 years 8 months ago
2008
ACM
We propose a new method for detecting patterns of anomalies in categorical datasets. We assume that anomalies are generated by some underlying process which affects only a particu...
DATE
1998
IEEE
13 years 11 months ago
1998
IEEE
Built-in self-test BIST techniques modify functional hardware to give a data path the capability to test itself. The modi cation of data path registers into registers BIST resourc...