Achieving design closure is one of the biggest headaches for modern VLSI designers. This problem is exacerbated by high-level design automation tools that ignore increasingly impo...
Zhenyu (Peter) Gu, Jia Wang, Robert P. Dick, Hai Z...
In a synchronous finite state machine (FSM), huge current peaks are often observed at the moment of state transition. Previous low power state encoding algorithms focus on the red...
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...
Orthogonal scan paths, which follow the path of the data flow, can be used in data path designs to reduce the test overhead -- area, delay and test application time -- by sharing ...
Many tasks in CAD, such as equivalence checking, property checking, logic synthesis, and false paths analysis require efficient Boolean reasoning for problems derived from circuits...
Andreas Kuehlmann, Viresh Paruthi, Florian Krohm, ...