This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
We have developed a generic integer linear programming(ILP)based engineering change(EC) methodology. The EC methodology has three components: enabling, fast, and preserving. Enabl...
Farinaz Koushanfar, Jennifer L. Wong, Jessica Feng...
The progressive trend of fabrication technologies towards the nanometer regime has created a number of new physical design challenges for computer architects. Design complexity, u...
Todd M. Austin, Valeria Bertacco, David Blaauw, Tr...
Technology-independenttimingoptimizationis animportantproblem in logic synthesis. Although many promising techniques have been proposed in the past, unfortunately they are quite s...
Abstract-- SAT sweeping is the process of merging two or more functionally equivalent nodes in a circuit by selecting one of them to represent all the other equivalent nodes. This ...
Stephen Plaza, Kai-Hui Chang, Igor L. Markov, Vale...