176 search results - page 19 / 36 » Techniques for Functional Test Pattern Execution |
SIGSOFT
2007
ACM
14 years 9 months ago
2007
ACM
The testing of the performance of opportunistic communication protocols and applications is usually done through simulation as i) deployments are expensive and should be left to t...
GLVLSI
2002
IEEE
14 years 1 months ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
ICCAD
1992
IEEE
14 years 26 days ago
1992
IEEE
Excessive power dissipation in integrated circuits causes overheating and can lead to soft errors and or permanent damage. The severity of the problem increases in proportion to t...
DAC
2005
ACM
13 years 10 months ago
2005
ACM
Parallelism in processor architecture and design imposes a verification challenge as the exponential growth in the number of execution combinations becomes unwieldy. In this paper...
DATE
1998
IEEE
14 years 1 months ago
1998
IEEE
Built-in self-test BIST techniques modify functional hardware to give a data path the capability to test itself. The modi cation of data path registers into registers BIST resourc...