Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Heterogeneous multiprocessors are growingly important in the multi-core era due to their potential for high performance and energy efficiency. In order for software to fully real...
We present a novel approach to conserve power in networked mobile devices. Our approach exploits communication within a pervasive smart space as an opportunity to save power as op...
Current multimedia applications are characterized by highly dynamic and non-deterministic behavior as well as high-performance requirements. In addition, portable devices demand a...
Javier Resano, Diederik Verkest, Daniel Mozos, Ser...
Abstract--Detailed diagnostic data is a prerequisite for debugging problems and understanding runtime performance in distributed wireless embedded systems. Severe bandwidth limitat...