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ASAP
2008
IEEE
142views Hardware» more  ASAP 2008»
14 years 3 months ago
Managing multi-core soft-error reliability through utility-driven cross domain optimization
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
Wangyuan Zhang, Tao Li
ISVLSI
2008
IEEE
136views VLSI» more  ISVLSI 2008»
14 years 3 months ago
A Real Case of Significant Scan Test Cost Reduction
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Selina Sha, Bruce Swanson
DASFAA
2007
IEEE
143views Database» more  DASFAA 2007»
14 years 3 months ago
Using Redundant Bit Vectors for Near-Duplicate Image Detection
Images are amongst the most widely proliferated form of digital information due to affordable imaging technologies and the Web. In such an environment, the use of digital watermar...
Jun Jie Foo, Ranjan Sinha
ICDCSW
2007
IEEE
14 years 3 months ago
Exploiting Gossip for Self-Management in Scalable Event Notification Systems
1 Challenges of scale have limited the development of event notification systems with strong properties, despite the urgent demand for consistency, reliability, security, and other...
Ken Birman, Anne-Marie Kermarrec, Krzysztof Ostrow...
IPPS
2007
IEEE
14 years 3 months ago
Leakage Energy Reduction in Value Predictors through Static Decay
As process technology advances toward deep submicron (below 90nm), static power becomes a new challenge to address for energy-efficient high performance processors, especially for...
Juan M. Cebrian, Juan L. Aragón, José...