162 search results - page 5 / 33 » Temperature Variable Supply Voltage for Power Reduction |
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
ISLPED
2010
ACM
13 years 7 months ago
2010
ACM
Estimation of static and dynamic energy of caches is critical for high-performance low-power designs. Commercial CAD tools performing energy estimation statically are not aware of...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
SRAM cell design is driven by the need to satisfy static noise margin, write margin and read current margin (RCM) over all cells in the array in an energy-efficient manner. These ...
AHS
2006
IEEE
14 years 1 months ago
2006
IEEE
Polymorphic electronics provides a new way for obtaining circuits that are able to perform two or more functions depending on the environment in which they operate. These function...
ICCD
2005
IEEE
14 years 4 months ago
2005
IEEE
As technology scales, power consumption and thermal effects have become challenges for system-on-chip designers. The rising on-chip temperatures can have negative impacts on SoC p...