532 search results - page 30 / 107 » Test Data Compression: The System Integrator's Perspective |
DFT
2006
IEEE
14 years 25 days ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
IV
1998
IEEE
13 years 11 months ago
1998
IEEE
alization of large volumes of abstract information requires mechanisms to support the user by knowledge discovering. Therefore we developed the level of data Therein the abstract ...
ISPD
2010
ACM
14 years 1 months ago
2010
ACM
Thermal/power issues have become increasingly important with more and more transistors being put on a single chip. Many dynamic thermal/power management techniques have been propo...
RECOMB
2003
Springer
14 years 7 months ago
2003
Springer
We develop a new framework for inferring models of transcriptional regulation. The models in this approach, which we call physical models, are constructed on the basis of verifiab...
MAGS
2007
13 years 6 months ago
2007
Abstract. The availability of massive amounts of biological data, distributed in various data sources, has prompted the development of a wide range of data analysis tools. However,...