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ACSE
1997
ACM
13 years 11 months ago
I/O considered harmful (at least for the first few weeks)
One of the major difficulties with teaching the first programming course is input/output. It is desirable to show students how to input data and output results early in the course...
John Rosenberg, Michael Kölling
SIGSOFT
2010
ACM
13 years 5 months ago
Future of developer testing: building quality in code
Although much progress has been made in software verification, software testing remains by far the most widely used technique for improving software reliability. Among various typ...
Tao Xie, Nikolai Tillmann, Jonathan de Halleux, Wo...
DATE
2004
IEEE
174views Hardware» more  DATE 2004»
13 years 11 months ago
Graph-Based Functional Test Program Generation for Pipelined Processors
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
Prabhat Mishra, Nikil Dutt
ETS
2009
IEEE
128views Hardware» more  ETS 2009»
13 years 5 months ago
Algorithms for ADC Multi-site Test with Digital Input Stimulus
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both ...
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido...
SIGDOC
2000
ACM
13 years 11 months ago
Testing documentation with "low-tech" simulation
∗ This paper introduces low-tech simulation as a technique for testing procedures and their documentation. The key idea is to test the interface-procedure-documentation set in th...
David G. Novick