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127
Voted
DSD
2006
IEEE
15 years 9 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
153
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DATE
2010
IEEE
15 years 8 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
133
Voted
VTS
2000
IEEE
15 years 8 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
123
Voted
ASPDAC
2006
ACM
15 years 7 months ago
2006
ACM
The verification of modern computing systems has grown to dominate the cost of system design, often with limited success as designs continue to be released with latent bugs. This t...
148
Voted
SIGSOFT
2010
ACM
15 years 1 months ago
2010
ACM
One of the main challenges in distributed development is ensuring effective communication and coordination among the distributed teams. In this context, little attention has been ...