203 search results - page 39 / 41 » Test Generation and Fault Localization for Quantum Circuits |
IWANN
2001
Springer
13 years 12 months ago
2001
Springer
Abstract. Intracellular recordings obtained under cutaneous and lemniscal stimulation show that the afferent fibers can establish excitatory and inhibitory synaptic connections w...
IJAIT
2010
13 years 6 months ago
2010
Many real world industrial applications involve finding a Hamiltonian path with minimum cost. Some instances that belong to this category are transportation routing problem, scan c...
IJOE
2007
13 years 7 months ago
2007
: An environment targeted to e-learning is presented for teaching design and test of electronic systems. The environment consists of a set of Java applets, and of web based access ...
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
DT
2000
13 years 7 months ago
2000
Effective high-level ATPG tools are increasingly needed, as an essential element in the quest for reducing as much as possible the designer work on gate-level descriptions. We pro...