203 search results - page 3 / 41 » Test Generation and Fault Localization for Quantum Circuits |
ICCAD
1991
IEEE
13 years 11 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
DFT
1997
IEEE
13 years 11 months ago
1997
IEEE
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...