203 search results - page 8 / 41 » Test Generation and Fault Localization for Quantum Circuits |
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
ATS
1996
IEEE
13 years 11 months ago
1996
IEEE
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
ET
1998
13 years 7 months ago
1998
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
DATE
2003
IEEE
14 years 23 days ago
2003
IEEE
