1016 search results - page 152 / 204 » Test Generation for Designs with On-Chip Clock Generators |
DAC
2010
ACM
14 years 7 days ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
CORR
2010
Springer
13 years 9 months ago
2010
Springer
Software development is rarely an individual effort and generally involves teams of developers collaborating to generate good reliable code. Among the software code there exist te...
IPCO
2004
13 years 10 months ago
2004
Managing an industrial production facility requires carefully allocating limited resources, and gives rise to large, potentially complicated scheduling problems. In this paper we c...
AAAI
1998
13 years 10 months ago
1998
This paper discusses the design and implementation of ESSPL, an expert system which generates security plans for alarm systems (Figure 1). Security planning is the task of determi...
MHCI
2009
Springer
14 years 3 months ago
2009
Springer
This paper describes a novel tool for eliciting user requirements early in the design process of mobile applications. The “Mobile Oracle”, as we have called it, is intended to...