1016 search results - page 166 / 204 » Test Generation for Designs with On-Chip Clock Generators |
GLVLSI
2005
IEEE
14 years 2 months ago
2005
IEEE
We perform a detailed study of various crosstalk scenarios in VDSM technologies by using a distributed model of the crosstalk site and make a number of key observations about the ...
DAC
2000
ACM
14 years 9 months ago
2000
ACM
Recently, intellectual property protection (IPP) techniques attracted a great deal of attention from semiconductor, system integration and software companies. A number of watermar...
PLDI
2009
ACM
14 years 3 months ago
2009
ACM
Taint analysis, a form of information-flow analysis, establishes whether values from untrusted methods and parameters may flow into security-sensitive operations. Taint analysis...
RECSYS
2009
ACM
14 years 1 months ago
2009
ACM
Critiquing-based recommenders do not require users to state all of their preferences upfront or rate a set of previously experienced products. Compared to other types of recommend...
DAC
2010
ACM
14 years 23 days ago
2010
ACM
As the geometry shrinking faces severe limitations, 3D wafer stacking with through silicon via (TSV) has gained interest for future SOC integration. Since TSV fill material and s...