1016 search results - page 49 / 204 » Test Generation for Designs with On-Chip Clock Generators |
SIGIR
2004
ACM
14 years 1 months ago
2004
ACM
Although text categorization is a burgeoning area of IR research, readily available test collections in this field are surprisingly scarce. We describe a methodology and system (...
ASPDAC
2009
ACM
14 years 2 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
EURODAC
1995
IEEE
13 years 11 months ago
1995
IEEE
This paper describes the features and design methodology of MIDA, a MPEG1 integrated audio decoder. MIDA has been almost completely designed using automatic synthesis of VHDL desc...
VLSID
2005
IEEE
14 years 1 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
There has been considerable research on quantum dots cellular automata as a new computing scheme in the nano-scale regimes. The basic logic element of this technology is a majorit...