1016 search results - page 54 / 204 » Test Generation for Designs with On-Chip Clock Generators |
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
ATS
2010
IEEE
13 years 5 months ago
2010
IEEE
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
TACAS
2009
Springer
14 years 2 months ago
2009
Springer
We describe the design and implementation of an automatic invariant generator for imperative programs. While automatic invariant generation through constraint solving has been exte...
ICCD
2007
IEEE
14 years 4 months ago
2007
IEEE
This paper presents a methodology to generate a hierarchy of power models for power estimation of custom hardware IP blocks, enabling a trade-off between power estimation accuracy...
OOPSLA
2007
Springer
14 years 1 months ago
2007
Springer
This article describes the design and use of the CUTE C++ testing framework and its integration into the Eclipse C++ Development Tooling. Unit testing supports code quality and is...