1016 search results - page 62 / 204 » Test Generation for Designs with On-Chip Clock Generators |
ISOLA
2010
Springer
13 years 6 months ago
2010
Springer
Abstract. This article deals with performance verifications of architecture models of real-time embedded systems. We focus on models verified with the real-time scheduling theory...
ICCAD
2010
IEEE
13 years 5 months ago
2010
IEEE
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
The verification of modern computing systems has grown to dominate the cost of system design, often with limited success as designs continue to be released with latent bugs. This t...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
Random test generators are often used to create regression suites on-the-fly. Regression suites are commonly generated by choosing several specifications and generating a number o...
ITC
1999
IEEE
14 years 23 hour ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...