1016 search results - page 69 / 204 » Test Generation for Designs with On-Chip Clock Generators |
VTS
1995
IEEE
13 years 11 months ago
1995
IEEE
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
RTSS
1998
IEEE
14 years 12 hour ago
1998
IEEE
The energy efficiency of systems-on-a-chip can be much improved if one were to vary the supply voltage dynamically at run time. In this paper we describe the synthesis of systems-...
COMPUTER
2002
13 years 7 months ago
2002
ion, so mapping between GUI events and the underlying code is not straightforward. Code-based coverage criteria do not necessarily address problematic interactions between the GUI&...
DAC
2011
ACM
12 years 7 months ago
2011
ACM
Just as electronic systems implement computation in terms of voltage (energy per unit charge), molecular systems compute in terms of chemical concentrations (molecules per unit vo...