1016 search results - page 73 / 204 » Test Generation for Designs with On-Chip Clock Generators |
BIRTHDAY
2006
Springer
13 years 11 months ago
2006
Springer
Abstract. We introduce a mathematical framework for black-box software testing of functional correctness, based on concepts from stochastic process theory. This framework supports ...
EUROPAR
2004
Springer
14 years 1 months ago
2004
Springer
The APART working group is developing the APART Test Suite (ATS) for evaluating (automatic) performance analysis tools with respect to their correctness – that is, their ability...
ICCAD
1994
IEEE
13 years 12 months ago
1994
IEEE
This paper presents a new method of selecting scan
ipops (FFs) in partial scan designs of sequential circuits. Scan FFs are chosen so that the whole circuit can be partitioned in...
ISCC
2008
IEEE
14 years 2 months ago
2008
IEEE
Mobile IPv6 (MIPv6) protocol is a new protocol designed to support the node mobility ofIPv6 protocol, which is a basic protocol of the next generation Internet. Protocol testing c...
ISPD
2000
ACM
14 years 4 days ago
2000
ACM
Recently, a deterministic algorithm based on the O-tree representation has been proposed. This method generates excellent layout results on MCNC test cases with O(n3 ) complexity,...