1016 search results - page 80 / 204 » Test Generation for Designs with On-Chip Clock Generators |
NDSS
2008
IEEE
14 years 3 months ago
2008
IEEE
Fuzz testing is an effective technique for finding security vulnerabilities in software. Traditionally, fuzz testing tools apply random mutations to well-formed inputs of a progr...
DAC
2003
ACM
14 years 2 months ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
CAV
2011
Springer
13 years 18 days ago
2011
Springer
Abstract. Many automatic testing, analysis, and verification techniques for programs can effectively be reduced to a constraint-generation phase followed by a constraint-solving ...
TSMC
1998
13 years 8 months ago
1998
Abstract—We present a general scheme for learning sensorimotor tasks which allows rapid on-line learning and generalization of the learned knowledge to unfamiliar objects. The sc...