1016 search results - page 82 / 204 » Test Generation for Designs with On-Chip Clock Generators |
GECCO
2004
Springer
14 years 2 months ago
2004
Springer
The method of evolutionary functional testing allows for the automation of testing by transforming test case design into an optimization problem. To this end it is necessary to def...
ARITH
1999
IEEE
14 years 1 months ago
1999
IEEE
Comprehensive testing of any implementation of the RSA cryptosystem requires the use of a number of moduli with specific properties. It is shown how to generate a sufficient varie...
APSEC
2004
IEEE
14 years 23 days ago
2004
IEEE
Domain testing, a technique for testing software or portions of software dominated by numerical processing, is intended to detect domain errors that usually arise from incorrect i...
ICCD
2006
IEEE
14 years 6 months ago
2006
IEEE
— In this paper, we are proposing a core-based test methodology that utilizes the functional bus for test stimuli and response transportation. An efficient algorithm for the gen...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...