135 search results - page 12 / 27 » Test Generation for Model-Based Diagnosis |
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
Errors in timing closure process during the physical design stage may result in systematic silicon failures, such as scan chain hold time violations, which prohibit the test of ma...
APIN
1998
13 years 7 months ago
1998
This paper describes a fuzzy diagnostic model that contains a fast fuzzy rule generation algorithm and a priority rule based inference engine. The fuzzy diagnostic model has been i...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...
ET
2002
13 years 7 months ago
2002
In this paper we explore two alternative approaches to system diagnosis. The first strategy is based on testability analysis performed by SATAN tool. The second approach performed ...