61 search results - page 9 / 13 » Test Pattern Generation Under Low Power Constraints |
ICANN
2003
Springer
14 years 24 days ago
2003
Springer
We suggest a new approach to optimize the learning of sparse features under the constraints of explicit transformation symmetries imposed on the set of feature vectors. Given a set...
CODES
2001
IEEE
13 years 11 months ago
2001
IEEE
Power consumption is an important design parameter for embedded and portable systems. Software-controlled (or dynamic) power management (DPM) has recently emerged as an attractive...
INFOCOM
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract— Given a wireless ad hoc network and an endto-end traffic pattern, the power rate function refers to the minimum total power required to support different throughput un...
MCS
2010
Springer
13 years 6 months ago
2010
Springer
Besides speed and period length, the quality of uniform random number generators is usually assessed by measuring the uniformity of their point sets, formed by taking vectors of s...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
A high-level test synthesis (HLTS) method targeted for delay fault testability is presented. The proposed method, when combined with hierarchical test pattern generation for embed...