2 search results - page 1 / 1 » Test Patterns Compression Technique Based on a Dedicated SAT... |
DSD
2010
IEEE
13 years 9 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
ICCAD
1999
IEEE
14 years 3 months ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...