Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...