The advances of CMOS technology towards 45 nm, the high costs of ASIC design, power limitations and fast changing application requirements have stimulated the usage of highly reco...
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
Abstract. This paper proposes a simplified simultaneous multithreading (SMT) architecture aiming at CPU cores of embedded SoCs for consumer applications. This architecture reduces...
Byung In Moon, Hongil Yoon, Ilgun Yun, Sungho Kang
— In this paper, we are proposing a core-based test methodology that utilizes the functional bus for test stimuli and response transportation. An efficient algorithm for the gen...
Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orail...